Acquisition parameters are saved, so that settings such as laser intensity, beam path configuration and scanning parameters can be recreated instantly by a click of a button. Efficient navigation allows you to go into detail – acquire an overview image and zoom in gradually while keeping an eye on the overview image.
Screenshot ZEN – Efficient Navigation for Industrial Microscopy
|Efficient Navigation for Industrial Microscopy|
The optional Topography software package transforms brightness levels into surface data. The software calculates the topography of micro-patterns and textured surfaces from the original data. In conjunction with LSM 700 in its configuration for materials analysis, the topography module forms an efficient system for fast, non-contact optical micro-profilometry. The package provides a range of quantitative measurement functions, including roughness, surface area and volume.
The StitchArt plus option expands the horizon of microscopy. In conjunction with your LSM 700 and a motorized scanning stage, extra-long line profiles or image stack arrays can be acquired, assembled and precisely quantified. These can extend to over a hundred times the size of the scan field! The StitchArt plus option integrates many automatic procedures and adjustment functions.