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 Screenshot ZEN – Efficient Navigation for Industrial Microscopy |
| Efficient Navigation for Industrial Microscopy |
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Acquisition parameters are saved, so that settings such as laser intensity, beam path configuration and scanning parameters can be recreated instantly by a click of a button. Efficient navigation allows you to go into detail – acquire an overview image and zoom in gradually while keeping an eye on the overview image.
The optional Topography software package transforms brightness levels into surface data. The software calculates the topography of micro-patterns and textured surfaces from the original data. In conjunction with LSM 700 in its configuration for materials analysis, the topography module forms an efficient system for fast, non-contact optical micro-profilometry. The package provides a range of quantitative measurement functions, including roughness, surface area and volume.
The StitchArt plus option expands the horizon of microscopy. In conjunction with your LSM 700 and a motorized scanning stage, extra-long line profiles or image stack arrays can be acquired, assembled and precisely quantified. These can extend to over a hundred times the size of the scan field! The StitchArt plus option integrates many automatic procedures and adjustment functions. | |
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