|Carl Zeiss reveals High Definition FE-SEM SIGMA HD||Downloads and Links|
english (126 KB)
|JENA/Germany, PHOENIX/Arizona/USA, 30.07.2012. |
The High Definition Field Emission Scanning Electron Microscope (FE-SEM) SIGMA HD is revealed at the Microscopy & Microanalysis conference 2012 in Phoenix, Arizona by Carl Zeiss Microscopy. SIGMA HD offers customers high resolution, fast imaging and easy sample navigation for nanoscale analytics in addition to the performance of the established SIGMA series.
SIGMA HD has been introduced to the SIGMA series as part of an expansion of the company’s FE-SEM portfolio. It incorporates advances in electronics, detectors and chamber design for imaging resolution as small as one nanometer. It is available in both high vacuum and variable pressure modes of operation. Finally, a 5-axis eucentric stage makes navigation around even large samples easy using both translational and tilted movement.
SIGMA HD offers unlimited analytical options through diametrically opposite chamber ports that facilitate the mounting of two energy dispersive X-ray spectroscopy (EDS) detectors for maximum solid angle detection. In the instance of beam sensitive samples, this permits low probe currents to be used whilst maintaining high X-ray count rates. The favorable geometry afforded by the chamber design eliminates X-ray shadowing effects.
Product Manager for the SIGMA series at Carl Zeiss, Dr. Ben Tordoff, commented: “Many customers have told us that there's a need for combining analytical flexibility and advanced imaging performance. SIGMA HD is an important addition to the portfolio providing exactly these benefits for many customers.”
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SIGMA HD from Carl Zeiss combines analytical flexibility and advanced imaging performance.
Photo: Courtesy of Carl Zeiss Microscopy
Dr. Jochen Tham
Carl Zeiss Microscopy GmbH
Phone: +49 3641 64-3949
Number: 0071-2012-ENG MI